Vol. XVIII · Free shipping $75+ · Read the collection
Login Register
Feature · Product Review

3506-10 C Hi-Tester (1kHz and 1MHz) - Low Noise Dedicated power supply for the

3506-10 C Hi-Tester (1kHz and 1MHz) - Low Noise Dedicated power supply for theC Hi Tester (1kHz and 1MHz) Low Noise High speed analog test time of 0. 6 ms (at 1 MHz) Improved noise resistance and enhanced repeatability in measurement precision even for production lines 1 kHz and 1 MHz measurement frequency supports stable low capacitance testing with taping machines BIN function, for easy component screening

SKU: 54874758600 · From www.marsberger-treibhaus.de

4.4
USD10375.00 USD10410.00

Pay in 4 interest-free payments of $2593.75 Learn more

Shipping Estimate
USA
  • USA
  • CAN

Ships within 48 hours · Estimated delivery Aug 4 - Aug 9

Description

Dedicated power supply for the CLAMP ON PROBE 3273-50/3274/3275/3276

The Hioki L1000 is a Voltage Cable Set

Temperature / Voltage Unit for MR8847

Optional power supply available for use with oscilloscopes that do not provide probe power

3506-10 C Hi-Tester (1kHz and 1MHz) - Low Noise Dedicated power supply for theC Hi Tester (1kHz and 1MHz) Low Noise High speed analog test time of 0. 6 ms (at 1 MHz) Improved noise resistance and enhanced repeatability in measurement precision even for production lines 1 kHz and 1 MHz measurement frequency supports stable low capacitance testing with taping machines BIN function, for easy component screening

Exchange/Return Notes
  • We offer a 30-day return/exchange service after receiving.
  • Final sale items are not eligible for returns or exchanges.
  • To process your return/exchange, please contact us at [email protected]
  • Please click here for more details>>> Return & Exchange Policy

You may also like

recommand products